Souvik Mahapatra

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Recent advances in experimental techniques (on-the- fly and ultrafast techniques) allow measurement of threshold voltage degradation due to negative-bias temperature instability (NBTI) over many(More)
Negative bias temperature instability (NBTI) is studied in plasma (PNO) and thermal (TNO) Si-oxynitride devices having varying EOT. Threshold voltage shift (DeltaVT) and its field (EOX), temperature(More)