Sooryong Lee

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Deterministic observation and random excitation of faultsites during the ATPG process dramatically reduces theoverall defective part level. However, multiple observationsof each fault site lead to increased test set size and requiremore tester memory. In this paper, we propose a new ATPGalgorithm to find a near-minimal test pattern set that detectsfaults(More)
" Forward-looking fault simulation for improved static compaction, " IEEE Trans. Comput.-Aided Design Integr. On static test com-paction and test pattern ordering for scan designs, " in Proc. Test vector decomposition-based static compaction algorithms for combinational circuits, " ACM Trans. Des. An experimental chip to evaluate test techniques experiment(More)
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