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As technology further scales semiconductor devices, aging-induced device degradation has become one of the major threats to device reliability. In addition, aging mechanisms like the negative bias temperature instability (NBTI) is known to be sensitive to workload (i.e., signal probability) that is hard to be assumed at design phase. In this work, we(More)
We propose an implementation of a secured content addressable memory (SCAM) based on homomorphic encryption (HE), where HE is used to compute the word matching function without the processor knowing what is being searched and the result of matching. By exploiting the shallow logic structure (XNOR followed by AND) of content addressable memory (CAM), we show(More)
As the transistor process technology continues to scale, the aging effect posits new challenges to the already complex static timing analysis (STA) process. In this paper, we first observe that aging can be thought of a type of correlated dynamic on-chip variations (OCV), and identify the problem introduced by such type of OCV. In particular, we take the(More)
Replacement of highly stressed logic gates with internal node control (INC) logics is known to be an effective way to alleviate timing degradation due to NBTI. Various INC replacement algorithms have been proposed, but there are no evaluations for the necessity of the signal probability update and the aged delay calculation during optimization, which are(More)
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