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—Although the trend of technology scaling is sought to realize higher performance computer systems, it also results in Integrated Circuits (ICs) suffering from increasing Process, Voltage, and Temperature (PVT) variations and adverse aging effects. In most cases, these reliability threats manifest themselves as timing errors on critical speed-paths of the(More)
The University of Central Florida's (UCF) Department of Electrical and Computer Engineering has developed the Electronic Lab Assessments with Tutoring Enhanced Delivery (ELATED) laboratory pedagogy using alternating creative portfolios and online formative assessment in the introductory course Computer Organization and Design. The ELATED method utilizes a(More)
A structured approach to video blogging (" vlogging ") has been piloted at the University of Central Florida (UCF) as a pedagogical tool to increase engagement in large-enrollment undergraduate courses. This two-phased activity enables a " risk-free " approach of increasing participation from all students enrolled in the course, as well as the opportunity(More)
—The continuous increase in transistor density based on Moore's Law has led us to Complementary Metal-Oxide Semiconductor (CMOS) technologies beyond 45nm process node. These highly-scaled process technologies offer improved density as well as a reduction in nominal supply voltage. New challenges also arise, such as relative proportion of leakage power in(More)
Spin-Transfer Torque Random Access Memory (STT-MRAM) has been explored as a post-CMOS technology for embedded and data storage applications seeking non-volatility, near-zero standby energy, and high density. Towards attaining these objectives for practical implementations, various techniques to mitigate the specific reliability challenges associated with(More)
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