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This paper presents the design of a low-power single-full-band (3.1-10.6 GHz) noncarrier impulse-radio ultra-wideband (UWB) transmitter (TX) implemented in a commercial 0.18-μm CMOS technology. This UWB TX features fifth-order Gaussian derivative pulse shaping, integrated binary phase-shift keying modulation and 2.5-kV whole-chip electrostatic(More)
In this paper, a single-chip pulse-based, non-carrier, full-band, low power ultra wideband (UWB) transceiver system-on-a-chip (SoC) for high data rate wireless video/audio/multimedia streaming applications is presented. This UWB SoC features a single full-band (7.5GHz bandwidth from 3.1GHz to 10.6GHz), pulse-based non-carrier architecture to achieve high(More)
—This paper reports a new nanocrystal quantum-dot (NC-QD)-based tunable on-chip electrostatic discharge (ESD) protection mechanism and structures. Experiments validated the pro-grammable ESD protection concept. Prototype structures achieved an adjustable ESD triggering voltage range of 2.5 V, very fast response to ESD transients of rising time t r ∼ 100 ps(More)
This paper reports a new nano crystal quantum dots (NC-QD) tunable on-chip electrostatic discharge (ESD) protection mechanism and structures. Experiments validated the programmable ESD protection concept. Prototype structures achieved an adjustable ESD triggering voltage range of 2.5V, very fast ESD response of ~100pS, ESD protection density of(More)
This paper reviews and discusses the design of a low-power single-full-band (3.1–10.6 GHz) noncarrier impulse-radio ultra wideband (UWB) transmitter featuring 5th-order Gaussian derivative pulse shaping, integrated BPSK modulation, and 2.5 kV whole-chip ESD (electrostatic discharge) protection. The UWB transmitter design has been implemented in a commercial(More)
Electrostatic discharge (ESD) protection becomes essential to advanced integrated circuits (IC). Very fast IEC-ESD failure and protection design are emerging challenges for contemporary ICs, particularly for consumer and portable electronics. This paper presents a new mixed-mode IEC-ESD simulation-design method, which involves process, device, circuit and(More)