Shuichi Shimomura

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X-ray scattering and electrical resistivity measurements were performed on SmNiC2. Satellite peaks characterized by an incommensurate wave vector (0.5, eta, 0) appear below 148 K, at which the resistivity shows an anomaly. The temperature dependence of thermal diffuse scattering above 148 K suggests critical phonon softening. These results indicate the(More)
Through various in situ analyses, we have revealed the structural changes that occur during the reversible melting-solidification process of layered alkylsiloxanes (CnLSiloxanes) with carbon numbers (n) of 18 and 16. In situ high-resolution solid-state (13)C nuclear magnetic resonance (NMR) analysis at controlled temperatures indicates drastic(More)
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