Shoji Kawahito

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For low-noise complementary metal-oxide-semiconductor (CMOS) image sensors, the reduction of pixel source follower noises is becoming very important. Column-parallel high-gain readout circuits are useful for low-noise CMOS image sensors. This paper presents column-parallel high-gain signal readout circuits, correlated multiple sampling (CMS) circuits and(More)
Digital still and video cameras require ADCs with high 14b or more of resolution to obtain sufficient image quality after the data pass through the color processing pipeline. A columnparallel ADC in CMOS image sensors helps to enable high-speed readout of high-quality images by preventing the large wideband noise caused by high-speed analog readout circuits(More)
This paper presents a high-speed CMOS image sensor with on-chip parallel image compression circuits. The chip consists of a pixel array, an A/D converter array with noise canceling function and an image compression processing element array and buffer memories. The image compression processing element is implemented with a 4times4 point discreate cosine(More)