Shobana Sudhakar

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— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures, gate-oxide wearout, and transient faults are becoming increasingly common. In order to overcome these issues and develop robust design techniques for large-market silicon ICs, it(More)
All Rights Reserved 2012 To my parents, Gail and Russell Greathouse. Without their support throughout my life, I would never have made it this far. ii Acknowledgments First and foremost, I must thank my advisor, Professor Todd Austin, for his help and guidance throughout my graduate career. I started graduate school with the broad desire to " research(More)
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