Shi Zhi Min

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This paper introduces a newly conceptualized and invented an electrical test capability for package defect detection based on “Capacitive Testing” for volume production. It is a “first of its kind” package defect testing in the Semiconductor industry, which offers a simple, fast and “fool proof” electrical test for(More)
The bandgap reference voltage source can provides a steady reference voltage when ambient temperature fluctuates. Based on the principle of curvature-compensated bandgap reference widely utilized at present, this paper analyzes the coefficients of high-order items of the voltage-temperature function expanded in Taylor series. And a low temperature(More)
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