Seyyed Iman Pishbin

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In this paper, switch-induced error voltage of a MOS switch in a deep submicron technology, is modeled and analyzed using a continuous and physical formulation based on the EKV model. In order to show the effectiveness of this error estimation model, it has been applied to correct the DAC switch-induced error voltages in a 12-bit 1Ms/s charge-redistribution(More)
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