Seung-kyung Lee

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In the after-assembly block manufacturing process in the shipbuilding industry, domain experts or industrial managers have the following questions regarding the first step in terms of reducing the overhead transportation cost due to irregularities not defined in a process design: ''What tasks are bottlenecks?'' and ''How long do the blocks remain waiting in(More)
Virtual metrology (VM) has been applied to semiconductor manufacturing processes for the quality management of wafers. However, noises included in training datasets degrade the performance of VM, which is a key obstacle to the application of VM in real-world semiconductor manufacturing processes. In this paper, we develop a VM dataset construction method by(More)
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