Sergei F. Lyuksyutov

Learn More
The past decade has witnessed an explosion of techniques used to pattern polymers on the nano (1-100 nm) and submicrometre (100-1,000 nm) scale, driven by the extensive versatility of polymers for diverse applications, such as molecular electronics, data storage, optoelectronics, displays, sacrificial templates and all forms of sensors. Conceptually, most(More)
We report the observation of anomalously high currents of up to 500 μA during direct oxide nanolithography on the surface of n-type silicon {100}. Conventional nanolithography on silicon with an atomic force microscope (AFM) normally involves currents of the order of 10−10–10−7 A and is associated with ionic conduction within a water meniscus surrounding(More)
Illumination of photosensitized (PMMA) with light triggers nonlinear polymerization processes. In this way periodical density structures with nearly 104 linesymm can be generated which are beyond the resolution limit of light-optical investigation methods. We report on the first direct experimental observation of such higher harmonics in deuterated (PMMA)(More)
Atomic Force Microscopy is an important tool for nanoscale modifications in metals, semiconductors, and soft condensed matter. Polymers suggest clear advantage with respect to the other materials in such fields as data storage and sacrificial patterning. Recently, an electrostatic nanolithography based on AFM [1,2] suggested a way of patterning(More)
Jian Chen,†,| Apparao M. Rao,† Sergei Lyuksyutov,‡ Mikhail E. Itkis,†,⊥ Mark. A. Hamon,†,⊥ Hui Hu,†,⊥ Robert W. Cohn,‡ Peter C. Eklund,† Daniel T. Colbert,§ Richard E. Smalley,§ and Robert C. Haddon*,†,⊥ Departments of Chemistry and Physics, AdVanced Carbon Materials Center, UniVersity of Kentucky, Lexington, Kentucky 40506-0055, Carbon Solutions, Inc, A(More)
A time-resolved method for tip' retraction at micros-scale away from dielectric surfaces has been developed. Analysis of the forces in the system comprising AFM tip, water meniscus, and polymer film suggests that an electrostatic repulsion of the tip from the surface in the double-layered (water and polymer) system, and water condensation in the tip-surface(More)
Nanoscale surface modification is reported for styrene butadiene rubber using an electrically biased conducting atomic force microscope tip. Under appropriate bias conditions, the local electric field magnitude is of the order of 108–109 V m−1, which is sufficiently large to initiate cross-linking in the rubber. Peaklike surface features, surrounded by a(More)
We apply nonlocal density-functional formalism to describe an equilibrium distribution of the waterlike fluid in the asymmetric nanoscale junction presenting an atomic force microscope tip dwelling above an arbitrary surface. The hydrogen bonding dominating in intermolecular attraction is modeled as a square-well potential with two adjustable parameters(More)
Mechanistic aspects of the reductive dehalogenation of trichloroethylene using zerovalent iron are studied with three different surface characterization techniques. These include scanning electron microscopy, surface profilometry, and atomic force microscopy. It was found that the pretreatment of an iron surface by chloride ions causes enhancement in the(More)