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At low frequencies, alternate testing is based on sampling the test response using an A/D converter and analyzing the digitized response in the external tester. In order to use alternate test at frequencies in the multi-GHz range, where the above is not possible, the test waveforms need to be very simple and the evaluation of the test response needs to be(More)
—This paper addresses the cost, signal integrity and I/O bandwidth problems in radio-frequency testing by proposing a feature extraction based built-in alternate test scheme. The scheme is suitable for built-in self-test of radio-frequency components embedded in a system with available digital signal processing resources, and can also be extended to(More)
Defect-based RF testing is a strong candidate for providing the best solution in terms of ATE complexity and cost. However, specification-based testing is still the norm for analog/RF because of the limitations of analog fault models. Unfortunately, as the amount of functionality packed into individual devices is increased with each generation, the cost of(More)
This paper summarizes an alternate test methodology that enables significant reduction in testing time and tester complexity for RF circuits without the need for low-level simulation models. Traditionally, alternate test makes use of circuit and process-level models to analyze the sensitivity of datasheet specifications to the variations in process(More)
— This paper describes an alternate test methodology for radio-frequency mixers. The methodology is based on current signatures obtained by sampling the filtered supply current when the circuit-under-test is stimulated by a single tone sinusoidal. Sampling of supply current instead of voltage eliminates the parasitics and loading due to test circuitry on(More)
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