Saverio Panarello

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A strong demand for even more compact and reliable power electronic devices has powered the development of advanced design techniques. A key role is played in these techniques by the reliability assessment, a procedure that estimates the expected lifetime according to given mission profiles. The reliability assessment of a low voltage MOSFET working in(More)
The on state resistance of power MOSFETs tasked to perform repetitive avalanche operations is subject to modifications caused by the growth of voids and cracks in the source metallization. Endurance tests are the traditional way to monitor these changes in order to assess the device reliability. However, they are very time expensive, requiring even months(More)
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