Satoshi Uemori

Learn More
— This paper describes a time-to-digital converter (TDC) architecture with fine time resolution, self-calibration and self-testing, and these features are realized by the following: (1) Encoder circuit that ensures monotonic characteristics. (2) Self-calibration circuit for linearity improvement. (3) Stochastic architecture for fine time resolution. (4)(More)
SUMMARY This brief paper describes design-for-testability (DFT) circuitry that reduces testing time and thus cost of testing DC linearity of SAR ADCs. We present here the basic concepts, an actual SAR ADC chip design employing the proposed DFT, as well as measurements that verify its effectiveness. Since the DFT circuit overhead is small, it is practicable.(More)
— This paper describes an algorithm for generating test signals to efficiently test the linearity of ADCs. Linearity is an important testing item for ADCs, and it takes a long time (hence is costly) to test low-sampling-rate, high-resolution ADCs. We here propose to generate a test signal consisting of multiple sine waves, to precisely test the linearity(More)
— This paper describes a background calibration algorithm for a pipelined ADC with an open-loop amplifier using a Split ADC structure. The open-loop amplifier is employed as a residue amplifier in the first stage of the pipelined ADC to realize low power and high speed. However it suffers from non-linearity, and hence needs calibration; conventional(More)
— This paper describes the architecture and principles of operation of sigma-delta (Σ∆) time-to-digital converters (TDC) for high-speed I/O interface circuit test applications; they offer good accuracy with short test times. In particular, we describe a multi-bit Σ∆ TDC architecture for fast testing. However, mismatches among delay cells in delay lines(More)
SUMMARY This brief paper describes a background calibration algorithm for a pipelined ADC with an open-loop amplifier using a Split ADC structure. The open-loop amplifier is employed as a residue amplifier in the first stage of the pipelined ADC to realize low power and high speed. However the residue amplifier as well as the DAC suffer from gain error and(More)
  • 1