Sassan Tabatabaei

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can be decomposed into several subcomponents, each having specific sets of characteristics and root-causes. This paper focuses on describing causes and measurement methods of jitter subcomponents. We first describe the relationship between a jitter PDF and bit error rate (BER) followed by a discussion on what causes jitter. Common jitter measurement methods(More)
The advent of serial communication links in chip-to-chip and systemto-system applications has resulted in intense focus on jitter and BER testing techniques, including jitter generation and measurement methodologies. We describe techniques for injection of random and deterministic jitter in controlled and programmable fashion, including a novel(More)