Sasithorn Chookaew

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In the recent years, diagnosing students' learning problems after testing and providing learning suggestions for them are an important research issue. Many studies have been conducted to develop a method for analyzing learning barriers of students such that helpful learning suggestions or guidance can be provided based on the analysis results. In this(More)
FinFET technology has increasingly been adopted for use within integrated circuits thanks to its superior electrical integrity and scalability. However, most recent studies have concluded that FinFET circuits tend to be more vulnerable to negative bias temperature instability (NBTI) compared to planar MOSFET designs as a result of the self-heating effect.(More)
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