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Journals and Conferences
The timing margin of an operating physical device suffers from crosstalk, power supply voltage fluctuation, and temperature variation among other elements. This problem is increasingly pronounced with deep-submicron technology. A conservative testing, binning and marketing policy alleviates the reliability concerns but at a loss of realizable performance of… (More)
This paper presents a novel design approach for addressing the pressing problem of noise and signal integrity in high-speed circuits. The approach uses a combination of gate-level redundancy in form of a shadow circuit, exception handling, and retry to tolerate random and delay faults that are of increasing concern in modern circuits. An empirical evidence… (More)
This tutorial overviews flash memory solid-state drive technologies and recent advances in the field.