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Journals and Conferences
SEE measurements and TID response for 25 nm Micron Technology NAND flash memories are reported. Radiation results of MLC 64 Gb parts are compared with results from SLC 32 Gb parts. Also, scaling effects on SEE and TID are discussed.
This paper reports heavy ion, proton, and laser induced single event effects results for a variety of microelectronic devices targeted for possible use in NASA spacecrafts. The compendium covers devices tested within the years of 2010 through 2012.
End-of-life issues affect everyone at some time. Individuals with chronic illness need to face these issues earlier to ensure their wishes are carried out. Patients with chronic kidney disease (CKD) Stage 5 have only three options: dialysis in its various forms, renal transplant, or death. In some cases, nurses who care for these patients feel they are… (More)