Sandeep Chatterjee

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Exceptions have traditionally been used to handle infrequently occurring and unpredictable events during normal program execution. Current trends in microprocessor and operating systems design continue to increase the cost of event handling. Because of the deep pipelines and wide out-of-order superscalar architectures of contemporary microprocessors, an(More)
Due to technology scaling, electromigration (EM) signoff has become increasingly difficult, mainly due to the use of inaccurate methods for EM assessment, such as the empirical Black's model. In this paper, we present a novel approach for EM checking using physics-based models of EM degradation, which effectively removes the inaccuracy, with negligible(More)
Electromigration (EM) is re-emerging as a significant problem in modern integrated circuits (IC). Especially in power grids, due to shrinking wire widths and increasing current densities, there is little or no margin left between the predicted EM stress and that allowed by the EM design rules. <i>Statistical Electromigration Budgeting</i> (SEB) estimates(More)
This paper is an exhaustive review summarizing the results, observations and findings of the renowned researchers in the domain of Web Service Discovery. After extensive scavenging on the Internet, we felt that there is a paucity of good quality survey papers, which can help, provide directions to a researcher looking for a fertile area to explore in the(More)
Electromigration (EM) in the on-die metal lines has re-emerged as a significant concern in modern VLSI circuits. The higher levels of temperature on die and the very large number of metal lines, coupled with the conservatism inherent in traditional EM checking strategies, have led to a situation where trying to guarantee EM reliability often leads to(More)
As society moves forth into the Information Age and computers become increasingly important, educators are faced with the dilemma of shrinking budgets and the need to purchase expensive computer equipment. This large investment on the part of schools is compounded by the rapid pace of technological advancement in the computer industry which makes computers(More)
We present a system architecture and framework for creating rapidly deployable intelligent environments. The rapid pace of innovation of computer hardware and intelligent systems software leads to uncertainty that deters manufacturers from adopting a single processor, network, or software environment for placement into their products. The MASC Composable(More)
This paper presents a novel framework and paradigm for creating rapidly deployable intelligent interactive environments, and in particular, homes. We argue that common household information appliances, such as televisions and stereos, present a seamless and nonintrusive point from which to "observe" and interact with members of a household ̄ To this end, we(More)
A novel electromigration (EM) assessment method based on a finite-difference (FD) approach has been implemented to study EM degradation in 3D integrated circuit (IC) supply current ports. A dual damascene copper through-silicon via (TSV) based EM test structure was used, which consisted of redistribution (RDL) and M1 metal layers connected by four TSVs on(More)