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CASP, Concurrent Autonomous chip self-test using <b>S</b>tored test <b>P</b>atterns, is a special kind of self-test where a system tests itself concurrently during normal operation without any downtime visible to the <b>end-user.</b> CASP consists of two ideas: 1. Storage of very thorough test patterns in non-volatile memory; and, 2. Architectural and(More)
This paper introduces an assertion scheme based on the brpwprd errw amlysis for error detection in algorithms that solve dense systems of linear equations, A z = b. Unlike previous methods, this Backward Error Assertion Model is specifically designed to operate in an environment of floating point arithmetic subject to round-off errors, and it can be easily(More)