Safiah Othman

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In this work, we report on the contact characteristics of Ti and Ag on unintentionally doped n-type Al/sub 0.10/Ga/sub 0.90/N film grown on sapphire substrate. Two different metallization schemes (bi-layer thin film); Ti/Ag and Ag/Ti were investigated. The effect of the additional application of annealing treatment at temperatures of 400 C and 800 C for 20(More)
125804-9595-IJET-IJENS © August 2012 IJENS I J E N S Abstract— Particle image velocimetry (PIV) is a nonintrusive, whole-field velocity measurement technique that has been used since the mid-1980s. The accuracy, flexibility and versatility offered by PIV systems have made them extremely valuable tools for flow studies. 3-D stereoscopic PIV is the package(More)
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