S. V. Venkatakrishnan

Suggest Changes

Writes About:

Learn More
High angle annular dark field (HAADF)-scanning transmission electron microscope (STEM) data is increasingly being used in the physical sciences to research materials in 3D because it reduces the(More)
HAADF-STEM data is increasingly being used in the physical sciences to study materials in 3D because it is free from the diffraction effects seen in Bright Field STEM data and satisfies the(More)