S. Watcharinyanon

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An x-ray photoemission electron microscope (X-PEEM) equipped with a hemispherical energy analyzer is capable of fast acquisition of momentum-resolved photoelectron angular distribution patterns in a complete cone. We have applied this technique to observe the 3-D ðE; k x ; k y Þ electronic band structure of zero-, one-, and two-monolayer (ML) graphene grown(More)
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