S.P. Zhao

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In this paper, a case study of BIST failure in SOI wafer fabrication was presented. With optimized charge neutralization using a well-controlled normal incident electron beam, a reliable depth distribution of K in the ILD was obtained which is helpful to understand the source of K contamination. From the SIMS and EDX results, the root cause was concluded to(More)
In the study, the ciprofloxacin resistance rate was 100%. High-level ciprofloxacin resistance rate was 63.55%. Sixteen different mutation patterns involved in the formation of ciprofloxacin resistance were identified. The most prevalent were patterns P7 (25.2%), P8 (15.0%), P9 (11.2%), P1 (10.3%), and P5 (10.3%). All of the 107 NG isolates analyzed for(More)
Surface charging is encountered in the study Auger electron spectroscopy of non-conducting surfaces. In this paper, two case studies of (i) Au-pad of packaged die unit and (ii) floating Al-pads of patterned wafer were presented. Surface charging was noticed in both the samples and it was not possible to eliminate the effect with convention charge reduction(More)
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