S. Lilly Christina

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As the capacity and density of embedded memories have rapidly increased, the probability of memory faults will increase. That results in yield drops and quality degradation.Yield improvement of embedded memories have become very important.Yield refers to the percentage of good die on the wafer. For embedded memories Built-In-Redundancy-Analysis (BIRA)is(More)
Design and simulation of a Micro Electro Mechanical Systems (MEMS) based optical signal processing beam former for cellular network base station is reported in this paper. The optical signal destined for a mobile terminal is split into eight equal-intensity signals. Each signal is complex weighted by controlling the phase and amplitude using a pair of(More)
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