S. Kaundinya

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In this paper we present a method to identify don't care locations in a fully specified set of vectors, considering both fault propagation path and fault activation path. We exploit the identified X bits to convert the original vector to low power vector by dictionary based approach to minimize both dynamic and runtime leakage power. The dynamic power as(More)
In the sub 70 nm technologies, the leakage power dominates dynamic power. Most of the power calculation methods account for dynamic power dissipation and static leakage power dissipation, but the runtime leakage is generally neglected. It has been shown in recent studies that the contribution of runtime leakage power to the total power dissipation is not(More)
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