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The authors propose a low-power testing methodology for the scan-based built-in self-test. This approach combines a low-power test pattern generator (TPG) with scan-chain reordering to achieve low-power testing without losing fault coverage. Three main issues are addressed. First, a smoother is included in the TPG to reduce the average power consumption.(More)
  • S.-J. Wang
  • 2005
The recent advances of the high throughput biotechnology have made the genome-wide scanning, single nucleotide polymorphisms (SNP) profiling and proteomic pattern profiling possible, in addition to the more traditional candidate genes approach. In this paper, we collectively use the term genomics to refer to the various technologies. As a result, a massive(More)
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