S. Huyghe

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This paper demonstrates the complementary relation between functional parameters and electroluminescence spectroscopy for reliability investigations of 1550 nm Semiconductor Optical Amplifiers of 700 µm length active region. Ageing tests have been set to 270 mA-100°C-1500 h and realized on two different wafers showing more impact on wafer 1 than on wafer 2.(More)
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