S. Blonkowski

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Due to strong requirement in term of capacitance voltage linearity, MIM capacitance stability during the whole operating lifetime of the product appears to be a key issue to warrant the reliability of this device. Using a constant current stress, two effects can be noticed on the evolution of the stressed C–V characteristics: a voltage shift to negative(More)
0026-2714/$ see front matter 2013 Elsevier Ltd. All rights reserved. http://dx.doi.org/10.1016/j.microrel.2013.07.003 ⇑ Corresponding author at: Laboratoire des Technologies de la Microélectronique – CNRS/UJF-CEA-LETI/Minatec, 17 Rue des Martyrs 38054, Grenoble Cedex 9, France. Tel.: +33 438 780 397. E-mail address: romain.foissac@cea.fr (R. Foissac). R.(More)
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