Russ Mohn

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A silicon‐proven multi‐finger turn‐on (MFT) design technique that enables ESD width scaling combined with very low dynamic on‐resistance is presented in various implementations. It can be applied to (self‐ protecting) drivers and/or ESD protection design. Using a novel merged ballast circuit design, very compact ESD protection configurations with an ESD(More)
– This paper presents a novel SCR for power line and local I/O ESD protection. The HHI-SCR exhibits a dual ESD clamp characteristic: low-current high-voltage clamping and high-current low-voltage clamping. These operation modes enable latch-up immune normal operation as well as superior full chip ESD protection. The minimum latch current is controlled by(More)
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