Runze Zhan

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Chengchun Zhao1
Shaozhi Deng1
1Chengchun Zhao
1Shaozhi Deng
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In situ characterization of the work function of quasi one dimensional nanomaterials is essential for exploring their applications. Here we proposed to use the electrostatic deflection induced by work function difference between nanoprobe and nanowire for in situ measuring the local work function along a free standing nanowire. The physical mechanism for(More)
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