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Ga(+) Focused Ion Beam-Scanning Electron Microscopes (FIB-SEM) have revolutionised the level of microstructural information that can be recovered in 3D by block face serial section tomography (SST),… Continue Reading
Minimizing surface damage during FIB specimen preparation is an important factor for high quality analytical results, especially in the case of TEM membrane and EBSD sample preparation. For… Continue Reading
The Electron Beam Ion Trap Microcalorimeter Spectrometer (ECS) routinely surveys the K-shell x-ray spectra that fall into the energy range between 200 eV and 14,000 eV. The spectra serve as in situ… Continue Reading
In this paper we show an efficient workflow that combines Magnetic Field Imaging (MFI) and Dual Beam Plasma Focused Ion Beam (DB-PFIB) for fast and efficient Fault Isolation and root cause analysis...
We present the science case for a broadband X-ray imager with high-resolution spectroscopy, including simulations of X-ray spectral diagnostics of both active regions and solar flares. This is part… Continue Reading
Abstract The use of novel multi-scale correlative methods, which involve the coordinated characterisation of matter across a range of length scales, are becoming of increasing value to materials… Continue Reading
The Negev - a region on the periphery of Israeli social and economic development ruminating over 50 years of Negev settlement the impact of mass immigration on urban settlements in the Negev the… Continue Reading
Abstract The complex mechanical response of open-cell foams depends strongly on the hierarchy of length scales inherent in them, from engineering-part scale to the ligament scale through the grain… Continue Reading
We report on novel X-ray mirrors fabricated with a focused ion beam for future astronomical missions. We fabricated a test sample from a silicon wafer by forming six slits whose sidewalls were used… Continue Reading