Romain Desplats

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Optical techniques (light emission and laser stimulation techniques) are routinely used for precise IC defect localization. At the early stage of an analysis, choosing the right technique is an increasingly complex task. In some cases, one technique may bring value but no the others. Using an 180nm test structure device we present results showing the(More)
Faster defect localization is achieved by combining IC simulations and internal measurements. Time resolved photon emission records photons emitted during commutations (current) rather than determining the voltage states. Comparing measured waveforms with simulations (STIL/VCD) localizes functional faults and timing issues. Summary Software diagnosis makes(More)