Robert W. Dutton

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Computer-aided design (CAD) techniques are absolutely essential to harness the ever-increasing complexity of the microsystem design. Similarly, the technology CAD (TCAD) tools played a key role in the development of new technology generations. Although there is a common belief that the TCAD tools have been trailing the technology development, the situation(More)
This paper presents an integrated framework, together with control policies, for optimizing dynamic control of self-tuning parameters of a digital system over its lifetime in the presence of circuit aging. A variety of self-tuning parameters such as supply voltage, operating clock frequency, and dynamic cooling are considered, and jointly optimized using(More)
The influence of gate direct tunneling current on ultrathin gate oxide MOS ( nm nm, – nm) circuits has been studied based on detailed simulations. For the gate oxide thickness down to 1.1 nm, gate direct tunneling currents, including the edge direct tunneling (EDT), show only a minor impact on low static-logic circuits. However, dynamic logic and analog(More)
We describe the implementation of a Monte Carlo model for electron transport in silicon. The model uses analytic, nonparabolic electron energy bands, which are computationally efficient and sufficiently accurate for future low-voltage s,1 Vd nanoscale device applications. The electron-lattice scattering is incorporated using an isotropic, analytic(More)
Based on measured four-noise parameters and two-port noise theory, considerations for noise optimization of integrated low-noise amplifier (LNA) designs are presented. If arbitrary values of source impedance are allowed, optimal noise performance of the LNA is obtained by adjusting the source degeneration inductance. Even for a fixed source impedance, the(More)
On-chip inductance is becoming increasingly important as technology continues to scale. This paper describes a way to characterize inductive effects in interconnects. It uses realistic test structures that study the effect of mutual couplings to local interconnects, to random lines connected to on-chip drivers, and to typical power and ground grids. The use(More)