Ritesh Kumar Sharma

We don’t have enough information about this author to calculate their statistics. If you think this is an error let us know.
Learn More
We show that the technique of Frequency Resolved Admittance Spectroscopy (FRAS) allows the identification of deep traps with reduced measurement effort compared to Deep Level Transient Spectroscopy (DLTS). This is shown by the analysis of radiation defects introduced in n-type 4H-SiC 1700V Schottky diodes.
As shale gas resources have emerged as a viable energy source, their characterization has gained significance. The organic content in these shales which are measured by their TOC ratings, influence the compressional and shear velocities as well as the density and anisotropy in these formations. Consequently, it should be possible to detect changes in TOC(More)
With the emergence of the shale gas resources as an important energy source, the characterization of mudrocks has gained significance. To be a good resource, mudrocks need to contain sufficient organic content and respond effectively to hydraulic fracturing. Variations in total organic carbon, as well as brit-tleness which is a function of mineralogy,(More)
  • 1