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- Philippe BÃ©nabÃ¨s, Mansour Keramat, Richard Kielbasa
- ED&TC
- 1997

A methodology for analysis and synthesis of lowpass sigma-delta (/spl Sigma//spl Delta/) converters is presented in this paper. This method permits to synthesize /spl Sigma//spl Delta/ modulatorsâ€¦ (More)

The Monte Carlo method exhibits generality and insensitivity to the number of stochastic variables, but is expensive for accurate yield estimation of electronic circuits. In the literature, severalâ€¦ (More)

- Sylvie Guessab, Philippe BÃ©nabÃ¨s, Richard Kielbasa
- The 2004 47th Midwest Symposium on Circuits andâ€¦
- 2004

This paper demonstrates at the transistor level that sigma-delta modulators using passive filters can be good candidates for low power applications. The circuit we propose is composed of a latch-typeâ€¦ (More)

- A. Yahias, Philippe BÃ©nabÃ¨s, Richard Kielbasa
- ISCAS
- 2001

The Monte Carlo (MC) method exhibits generality and insensitivity to the number of stochastic variables, but it is expensive for accurate Average Quality Index (AQI) or Parametric Yield estimation ofâ€¦ (More)

- Yoan Dupret, Richard Kielbasa
- Proceedings. The 16th International Conference onâ€¦
- 2004

With the shrinking of transistor sizes, semiconductor manufacturing production costs are getting higher and higher. Predicting manufacturing yield helps engineers to take decision earlier in theâ€¦ (More)

- Ã‰ric Colinet, JÃ©rÃ´me Juillard, Sylvie Guessab, Richard Kielbasa
- 2004 International Conference on MEMS, NANO andâ€¦
- 2004

This paper presents a new design of a closed-loop sigma-delta accelerometer using an acceleration prediction feedback element. Thanks to a Kalman state estimator associated with aâ€¦ (More)

- S. Benabid, E. Najafi Aghdam, Philippe BÃ©nabÃ¨s, Sylvie Guessab, Richard Kielbasa
- Proceedings of the Fifth IEEE Internationalâ€¦
- 2004

This paper presents the design technique for a high speed sixth order bandpass continuous-time sigma-delta modulator in a standard 0.35/spl mu/m CMOS technology. Three resonators are implemented in aâ€¦ (More)

- Yoan Dupret, E. Perrin, J.-L. Grolier, Richard Kielbasa
- IEEE/SEMI Conference and Workshop on Advancedâ€¦
- 2005

During a semiconductor manufacturing process a large amount of data is stored in databases. These data can be used to model the semiconductor manufacturing yield. A model of the yield according toâ€¦ (More)