The DFT and Test challenges faced, and the solutions applied, to the ARMl026EJ microprocessor core are described in this paper. New DFT techniques have been created to address the challenges of distributing a DFT core solution that will ultimately end up in many different environments. This core was instantiated into a test chip. The new DFT features were… (More)
A test methodology for the control signals including clock logic, ripple reset and register file read/write control of the Cortex-A8 TM high performance microprocessor core is presented. The target fault models include the stuck-at fault, transition fault and hold time fault models.