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Radiation-induced soft errors have become a key challenge in advanced commercial electronic components and systems. We present the results of a soft error rate (SER) analysis of an embedded processor. Our SER analysis platform accurately models generation, propagation, and masking effects starting from a technology response model derived using TCAD(More)
Fast and accurate soft error vulnerability assessment is an integral part of cost-effective robust system design. The de facto approach is expensive fault simulation or emulation in which the error is injected in random bits and cycles, and then the effect is simulated for millions of cycles. In this paper, we propose a novel alternative approach to obtain(More)
Radiation-induced soft errors have become a key challenge in advanced commercial electronic components and systems. We present results of Soft Error Rate (SER) analysis of an embedded processor. Our SER analysis platform accurately models all generation, propagation and masking effects starting from a technology response model derived using TCAD simulations(More)
Multiple bit upsets due to radiation-induced soft errors are a major concern in nanoscale technology nodes. Once such errors occur in the configuration frames of an FPGA device, they permanently affect the functionality of the mapped design. The combination of error correction schemes and configuration scrubbing is an efficient approach to avoid such(More)
Predicting MOSFET models plays a pivotal role in circuit design and its optimization. Independent Gate FinFETs (IGFinFET) are interesting for designers as they are more flexible than Common Multi-Gate FinFETs (CMGFinFET) in digital circuit design. In this work, we implement a model for symmetrical IGFinFET using CMGFinFET model based on Multi-Gate(More)
NoC-based designs provide a scalable and flexible communication solution for the rising number of processing cores on a single chip. To master the complexity of the software design in such a NoC-based multi-core architecture, advanced incremental integration testing solutions are required. This work presents a virtual platform based software testing and(More)
With the ever increasing industrial demand for bigger, faster and more efficient systems, a growing number of cores is integrated on a single chip. Additionally, their performance is further maximized by simultaneously executing as many processes as possible not regarding their criticality. Even safety critical domains like railway and avionics apply these(More)
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