Razaidi Hussin

Learn More
— New architectures introduction succeeded in reducing the device performances dispersion in scaled transistors, but as a consequence the relative importance of oxide reliability increased. In this work we present original results of charged interface traps impact on bulk, FDSOI and Fin FETs performances. Traps time constants are analyzed and recoverable(More)
Fourier transform infra red (FTIR) and energy band gap of potassium lithium borate glasses of different composition have been studied using Fourier FTIR and UV-VIS spectroscopy techniques. The glasses were melted in the alumina crucible in an electric furnace at 1100°C for 30 min until homogenous melt was obtained. The X-ray diffraction analysis was adopted(More)
  • 1