Ramses van der Toorn

We don’t have enough information about this author to calculate their statistics. If you think this is an error let us know.
Learn More
In this paper an extensive verification of the extraction method (published earlier) that consistently accounts for self-heating and Early effect to accurately extract both base and thermal resistance of bipolar junction transistors is presented. The method verification is demonstrated on advanced RF SiGe HBTs were the extracted results for the thermal(More)
  • 1