Rajesh Mittal

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This paper discusses how adaptive test techniques can be applied to multi-core RF SoCs, together with design implementation and test challenges. Various techniques specific to RF circuits covering calibration trims, power management modules, co-existence issues, concurrent testing, and test measurements are explained. Results on different designs are(More)
Summary form only given, as follows. The complete presentation was not made available for publication as part of the conference proceedings. Drastic increase in design complexity along with the emergence of new failure mechanisms in the nanometer regime has led to significant increase in the complexity of verification, validation, and debug of integrated(More)
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