R. J. S. Young

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This paper discusses typical grounding practices and ground fault protection methods for medium-voltage generator stators, highlighting their merits and drawbacks. Particular attention is given to applications of multiple generators connected to a single bus. The paper also provides an overview of the generator damage mechanism during stator ground faults.(More)
Many owners of distributed resources such as synchronous industrial plant or commercial facility generators (ICG) are concerned about the requirements for protective relaying when connecting to a local utility. The connection may only be for a short transfer time of a few seconds during paralleling for periodic testing. The power rating of an ICG is not(More)
This paper discusses typical grounding practices and ground fault protection methods for medium-voltage generator stators, highlighting their merits and drawbacks. Particular attention is given to applications of multiple generators connected to a single bus. The paper also provides an overview of the generator damage mechanism during stator ground faults.(More)
Recently, n-type crystalline Si (c-Si) cells with front-side (FS) metallization Ag/Al paste have attracted considerable attention. However, a clear understanding of current conduction mechanism is still lacking. We report here the results of our microstructural investigation of the interfacial contact region using electron microscopy techniques. In(More)
The paper discusses typical grounding practices and ground fault protection methods for medium voltage generator stators, highlighting their merits and drawbacks. Particular attention is given to applications of multiple generators connected to a single bus. The paper also provides an overview of the generator damage mechanism during stator ground faults.(More)
Many owners of distributed resources such as synchronous industrial plant or commercial facility generators (ICG) are concerned about the requirements for protective relaying when connecting to a local utility. The connection may only be for a short transfer time of a few seconds during paralleling for periodic testing. A tendency is to look at the(More)
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