R.J. Pratap

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This paper reports an interconnect modeling approach for RF and millimeter-wave integrated circuits (ICs) using neural network models and a novel parasitic extraction verification procedure using automatically generated test structures. The effects of the parasitics in RF/millimeter-wave ICs are investigated with special focus on the parasitic inductances,(More)
In this paper, a new technique for design centering and the yield enhancement of millimeter-wave (MMW) circuits is presented using neural networks for circuit modeling and genetic algorithms for parametric yield optimization. A Monte Carlo based method is developed for the yield estimation utilizing the neural network models. The neuro-genetic methodology(More)
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