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[1] The Aerodyne Aerosol Mass Spectrometer (AMS) has been designed to measure size-resolved mass distributions and total mass loadings of volatile and semivolatile chemical species in/on submicron particles. This paper describes the application of this instrument to ambient aerosol sampling. The AMS uses an aerodynamic lens to focus the particles into a(More)
S oft errors, also called single-event upsets (SEUs), are radiation-induced transient errors caused by neutrons from cosmic rays and alpha particles from packaging material. Traditionally, soft errors were regarded as a major concern only for space applications. Yet, for designs manufactured at advanced technology nodes—such as 90 nm, 65 nm, and(More)
EPA, it has not been subjected to the Agency's required peer and policy review and therefore does not necessary reflect the views of the Agency, and no official endorsement should be inferred. The authors thank the MTA for their cooperation, including Chris Bush for providing bus fleet information and Dana Lowell for help in organizing the logistics of the(More)
improvement is tunable by selective placement of the presented error-correcting designs. When coupled with error correction code to protect in-pipeline memories, the BISER flip-flop design improves chip-level SER by 10 times over an unprotected pipeline with the flip-flops contributing an extra 7–10.5% in power. When only soft errors in flips-flops are(More)
Pulmonary inflammation can contribute to the development of lung cancer in humans. We investigated whether pulmonary inflammation alters the genotoxicity of polycyclic aromatic hydrocarbons (PAHs) in the lungs of mice and what mechanisms are involved. To model nonallergic acute inflammation, mice were exposed intranasally to lipopolysaccharide (LPS; 20(More)
Test chips built in a 32nm bulk CMOS technology consisting of hardened and non-hardened sequential elements have been exposed to neutrons, protons, alpha-particles and heavy ions. The radiation robustness of two types of circuit-level soft error mitigation techniques has been tested: 1) SEUT (Single Event Upset Tolerant), an interlocked, redundant state(More)
BACKGROUND The Affymetrix GeneChip® system is a commonly used platform for microarray analysis but the technology is inherently expensive. Unfortunately, changes in experimental planning and execution, such as the unavailability of previously anticipated samples or a shift in research focus, may render significant numbers of pre-purchased GeneChip®(More)
— This paper introduces a novel robotic range sensor planning system, which is developed for 3D dimensional inspection of automotive body parts. For active, triangulation-based range sensors, shadow and reflection will cause problems when measure a metal part with glossy and discontinuous surface. To solve these problems, a feedback based dynamic view(More)