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[1] The Aerodyne Aerosol Mass Spectrometer (AMS) has been designed to measure size-resolved mass distributions and total mass loadings of volatile and semivolatile chemical species in/on submicron particles. This paper describes the application of this instrument to ambient aerosol sampling. The AMS uses an aerodynamic lens to focus the particles into a(More)
S oft errors, also called single-event upsets (SEUs), are radiation-induced transient errors caused by neutrons from cosmic rays and alpha particles from packaging material. Traditionally, soft errors were regarded as a major concern only for space applications. Yet, for designs manufactured at advanced technology nodes—such as 90 nm, 65 nm, and(More)
Test chips built in a 32nm bulk CMOS technology consisting of hardened and non-hardened sequential elements have been exposed to neutrons, protons, alpha-particles and heavy ions. The radiation robustness of two types of circuit-level soft error mitigation techniques has been tested: 1) SEUT (Single Event Upset Tolerant), an interlocked, redundant state(More)
BACKGROUND The Affymetrix GeneChip® system is a commonly used platform for microarray analysis but the technology is inherently expensive. Unfortunately, changes in experimental planning and execution, such as the unavailability of previously anticipated samples or a shift in research focus, may render significant numbers of pre-purchased GeneChip®(More)
— This paper introduces a novel robotic range sensor planning system, which is developed for 3D dimensional inspection of automotive body parts. For active, triangulation-based range sensors, shadow and reflection will cause problems when measure a metal part with glossy and discontinuous surface. To solve these problems, a feedback based dynamic view(More)