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A novel region-based level set method initialized with mean shift clustering for automated medical image segmentation
Appropriate initialization and stable evolution are desirable criteria to satisfy in level set methods. In this study, a novel region-based level set method utilizing both global and local imageExpand
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Leptin promotes metastasis by inducing an epithelial-mesenchymal transition in A549 lung cancer cells.
Leptin, an adipocyte-derived cytokine associated with obesity, has been reported to participate in carcinogenesis. Epithelial-mesenchymal transition (EMT) is also considered as a key event in tumorExpand
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Chronic Unpredictable Mild Stress in Rats Induces Colonic Inflammation
Chronic psychological stress is associated with an increased risk for relapse of inflammatory bowel diseases (IBD) and impedes the treatment of this condition. However, the impact of stress on theExpand
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Fully automatic multi-atlas segmentation of CTA for partial volume correction in cardiac SPECT/CT.
Anatomical-based partial volume correction (PVC) has been shown to improve image quality and quantitative accuracy in cardiac SPECT/CT. However, this method requires manual segmentation of variousExpand
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Esophageal Cancer: Should Gender Be Considered as an Influential Factor for Patient Safety in Drug Treatment?
Aim Analyze the gender difference of esophageal cancer patients in response to drug treatment. Methods All publications on clinical trials were collected from PubMed, Scopus, and PMC. EachExpand
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Ramucirumab in metastatic renal cell carcinoma: The sex, race, and age issues
In an editorial, Drs. Pal and Figlin made substantial comments regarding the results of the study by Garcia et al from a phase 2 trial of ramucirumab in patients with metastatic renal cell carcinomaExpand
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Simulation of electromigration induced stress of solder
In this paper, failure modes of solder under electromigration were shown, the failure mechanism was usually attributed to tensile stress at cathode and compressive stress at anode. To evaluate theExpand
Influence of stress on the electromigration life of solder
It was suggested that electromigration (EM) life of solder can be improved by proper choice of stress property (compressive or tensile) at the two corners where electron current enter and exit. InExpand
An observation and explanation of interior cracking at the interface of solder by electromigration
Abstract The electromigration (EM) of a solder joint under high-current stressing causes damage and reduces its service life. Previous studies have suggested that EM-induced cracks typically initiateExpand
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