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—Phase change memory (PCM) has been widely studied as a potential DRAM alternative. The multi-level cell (MLC) can further increase the memory density and reduce the fabrication cost by storing multiple bits in a single cell. Nevertheless, large write power, high write latency, as well as reliability issue resulted from the resistance drift, bring in(More)
Processing-in-memory (PIM) provides high bandwidth, massive parallelism, and high energy efficiency by implementing computations in main memory, therefore eliminating the overhead of data movement between CPU and memory. While most of the recent work focused on PIM in DRAM memory with 3D die-stacking technology, we propose to leverage the unique features of(More)
—Three-dimensional integrated circuit (3D IC) is a promising solution to continue the performance scaling. However, the fabrication cost for 3D ICs can be a major concern for the adoption of this emerging technology. In this paper, we study the cost implication for both TSV-based and interposer-based 3D ICs, with the observation that many long metal(More)
—3D integration is one of the promising solutions to overcome the interconnect bottleneck with vertical interconnect through-silicon vias (TSVs). This paper investigates the crosstalk in 3D IC designs, especially the capacitive crosstalk in TSV interconnects. We propose a novel ω-LAT coding scheme to reduce the capacitive crosstalk and minimize the power(More)
The thermomechanical stress has been considered as one of the most challenging problems in three-dimensional integration circuits (3D ICs), due to the thermal expansion coefficient mismatch between the through-silicon vias (TSVs) and silicon substrate, and the presence of elevated thermal gradients. To address the stress issue, we propose a thorough(More)
—Energy becomes the primary concern in nowadays multi-core architecture designs. Moore's law predicts that the exponentially increasing number of cores can be packed into a single chip every two years, however, the increasing power density is the obstacle to continuous performance gains. Recent studies show that heterogeneous multi-core is a competitive(More)
The emerging three-dimensional (3D) chip architectures, with their intrinsic capability of reducing the wire length, is one of the promising solutions to mitigate the interconnect problem in modern microprocessor designs. To leverage the benefits of fast latency, high bandwidth, and heterogeneous integration capability that are offered by 3D technology, new(More)
—As the number of processing elements increases in a single chip, the interconnect backbone becomes more and more stressed when serving frequent memory and cache accesses. Network-on-Chip (NoC) has emerged as a potential solution to provide a flexible and scalable interconnect in a planar platform. In the mean time, three-dimensional (3D) integration(More)
—The emerging three-dimensional integrated circuit (3D IC) provides a promising solution for sustainable computer performance scaling. However, the high cost due to the complex pre-bond/intermediate testing and the low compound yield hinder the commercial adoption of 3D ICs. The defect clustering is found biasing the yield prediction, resulting in an(More)
Electromigration (EM) can cause severe reliability issues in contemporary integrated circuits. For the emerging three-dimensional integrated circuits (3D ICs), the introduction of through-silicon vias (TSVs) as the vertical signal carrier complicates the electromigration analysis. In particular, an accurate EM analysis on TSV arrays that are used in the(More)