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Phase change memory (PCM) has been widely studied as a potential DRAM alternative. The multi-level cell (MLC) can further increase the memory density and reduce the fabrication cost by storing multiple bits in a single cell. Nevertheless, large write power, high write latency, as well as reliability issue resulted from the resistance drift, bring in(More)
Processing-in-memory (PIM) provides high bandwidth, massive parallelism, and high energy efficiency by implementing computations in main memory, therefore eliminating the overhead of data movement between CPU and memory. While most of the recent work focused on PIM in DRAM memory with 3D die-stacking technology, we propose to leverage the unique features of(More)
3D integration is one of the promising solutions to overcome the interconnect bottleneck with vertical interconnect through-silicon vias (TSVs). This paper investigates the crosstalk in 3D IC designs, especially the capacitive crosstalk in TSV interconnects. We propose a novel ω-LAT coding scheme to reduce the capacitive crosstalk and minimize the(More)
As one of the most promising solutions to the wellknown interconnect crisis, three-dimensional (3D) integration attracts plenty of attention from both academia and industry communities. 3D integration techniques enable much shorter interconnect wire length, much higher memory bandwidth, and heterogeneous integration. These benign effects lead to a variety(More)
The thermomechanical stress has been considered as one of the most challenging problems in three-dimensional integration circuits (3D ICs), due to the thermal expansion coefficient mismatch between the through-silicon vias (TSVs) and silicon substrate, and the presence of elevated thermal gradients. To address the stress issue, we propose a thorough(More)
Three-dimensional (3D) ICs promise to overcome barriers in integration density and interconnect scaling by leveraging fast, dense inter-die vias, thereby offering benefits of improved performance, higher memory bandwidth, smaller form factors, and heterogeneous integration. 3D integration provides additional architectural and technology-related design(More)
Energy becomes the primary concern in nowadays multi-core architecture designs. Moore's law predicts that the exponentially increasing number of cores can be packed into a single chip every two years, however, the increasing power density is the obstacle to continuous performance gains. Recent studies show that heterogeneous multi-core is a competitive(More)
Electromigration (EM) can cause severe reliability issues in contemporary integrated circuits. For the emerging three-dimensional integrated circuits (3D ICs), the introduction of through-silicon vias (TSVs) as the vertical signal carrier complicates the electromigration analysis. In particular, an accurate EM analysis on TSV arrays that are used in the(More)