Professor B. Mazoyer

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Charge trapping and detrapping characteristics have been studied on thin Si<sub>3</sub>N<sub>4</sub>/SiO<sub>2</sub> stacked dielectric layers processed in an integrated vacuum system with separate modules for HF vapor etching, silicon thermal oxidation and Si<sub>3</sub>N<sub>4</sub> low pressure chemical deposition. At low field, polarization effects are(More)
The sensitivity and reproducibility of rapid measurements of regional cerebral flow (rCBF) using a bolus injection of H2 15O and dynamic positron emission tomography (PET) were investigated in anaesthetised baboons. The cerebrovascular reactivity to changes in arterial pCO2 was used as an experimental support. PET data were acquired over 4 min following a(More)
The EPROM charge loss is linked to electron trapping, depending on electric field inside the interpoly dielectric at the end of the programming step. With respect to this behavior, the bottom oxide-nitride interface qualities and trapping properties, together with electron injection from floating gate to the interpoly dielectric during cell programming are(More)
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