Priyadarshini Ranganath

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Advanced molecular nanotechnology devices are expected to have exceedingly high transient fault rates and large numbers of inherent device defects compared to conventional CMOS devices. We introduce the Recursive NanoBox Processor Grid as an application specific, fault-tolerant, parallel computing system designed for fabrication with unreliable(More)
Semiconductor fabrication trends indicate that emerging process technologies will experience an increase in the number of noise induced errors and device defects. While past work in fault tolerance has focused on static testing, modular redundancy in combinational logic, and error correcting codes in memories, the prevalence of transient errors may make(More)
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