Piyanart Kongtim

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In this paper, a novel parallel LFSR reseeding technique for mixed-mode BIST that is suitable and applicable to a multiple scan chain design. This approach can be applied to generate test cubes that detect Random Pattern Resistant (RPR) faults. A multiple test vector is used to guide the LFSR in order to generate target test cube at the application time.(More)
This research presents a new method in order to generate test patterns generator for testing electronic circuit in Mixed-mode BIST with Parallel Linear Feedback Shift Register (LFSR) Reseeding. The dynamic seeds were injected in parallel form through the LFSR, phase shifter, and scan chains, respectively. The research not only proposed the Parallel LFSR(More)
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